OPTIMASI NILAI RESISTANSI PADA RANGKAIAN RESISTANSI KOMBINASI PARALEL-SERI YANG SETARA DENGAN NILAI RESISTANSI RUSAK MENGGUNAKAN ALGORITMA GENETIKA

  • F.X. Wisnu Yudo Untoro
DOI: https://doi.org/10.33579/krvtk.v4i2.1562

Abstract

This paper discusses the limited availability of resistance values used to obtain the resistance value of a damaged resistor. The proposal offered is to use a parallel-series combination resistance circuit form. To obtain the resistance values for a series of parallel-series combination resistor in order to produce a resistance value equivalent to the resistance value of the damaged resistor using a genetic algorithm. The simulation results show that by providing input in the form of resistance value of the damaged resistor of 75 ῼ, population number 10, number of generations of 50, as well as by input of genetic algorithm operators, between a 90% crossover probability, and 10% gene mutation probability an equivalent resistance value is obtained with the resistance value of the damaged resistor for the parallel-series combination resistance circuit being R1= 50 ῼ, R2 = 50 ῼ, and R3 = 50 ῼ..

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Published
2019-12-21
How to Cite
[1]
F.X. Wisnu Yudo Untoro, “OPTIMASI NILAI RESISTANSI PADA RANGKAIAN RESISTANSI KOMBINASI PARALEL-SERI YANG SETARA DENGAN NILAI RESISTANSI RUSAK MENGGUNAKAN ALGORITMA GENETIKA”, Journal Technology of Civil, Electrical, Mechanical, Geology, Mining, and Urban Design, vol. 4, no. 2, pp. 53-60, Dec. 2019.
Issue
Vol 4 No 2 (2019): November 2019
Section
Articles

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